Contact Probe for Resistance Measurement for Semiconductor Testing
Introduction of a wide lineup of 4-probe probes for achieving high resistivity measurements. Comprehensive product support available. *Materials provided.
Micro Point Pro's "4-Needle Probe (Contact Probe)" features high-quality high-speed steel, characterized by extremely low resistance values. The tip uses carbide and osmium alloys, allowing for choices in durability and electrical contact properties. The probe body offers a reliable solution for resistivity measurement with the "Fell Probe (Chrome-Plated Body)," as well as two other types: "Disposable Probe (Plastic Body)" and "Al Probe (Aluminum Body)." 【Features】 ■ Low-friction upper guide ■ Wide selection of probe tip radii ■ Individual needle pressure adjustment ■ High breakdown voltage and low leakage
- 企業：Micro Point Pro ltd 本社
- 価格：Other
